Semiconductor Materials Laboratory
Research Field
The Principal Investigator, Professor Jeou-Long Lee, is currently a professor in the Department of Semiconductor Engineering at Lunghwa University of Science and Technology. He holds a Ph.D. in Chemical Engineering from National Taiwan University of Science and Technology and previously served as an engineer at the China Textile Institute, giving him extensive experience in both academic research and industrial practice. His research expertise includes surface treatment, thin-film processing, composite coatings, micro-arc oxidation, and wastewater treatment technologies. These areas can be further applied to semiconductor material surface modification, functional thin-film deposition, metal electrode and interface engineering, protective materials for semiconductor packaging, and device reliability enhancement. Professor Lee is familiar with the effects of material composition, thin-film structure, and surface properties on the electrical performance, thermal stability, and corrosion resistance of semiconductor devices. He also possesses expertise in semiconductor-related material selection, process integration, surface characterization, and failure analysis, enabling him to effectively lead research and technology development in semiconductor materials, thin-film processes, and device applications.
The Semiconductor Materials Laboratory focuses on the analysis, characterization, and process evaluation of advanced semiconductor materials. Its primary research activities include the investigation of material composition, crystal structure, surface morphology, thin-film thickness, interface properties, and electrical characteristics, with the aim of establishing correlations among material structures, processing conditions, and device performance.
The laboratory’s research covers silicon-based semiconductors, wide-bandgap semiconductors, metallic and dielectric thin films, functional coatings, and nanomaterials. Various analytical techniques are employed, including microstructural observation, elemental composition analysis, phase identification, surface and interface characterization, and electrical measurements. These techniques are used to evaluate material defects, contamination, thin-film uniformity, adhesion, and failure mechanisms.
Through systematic material characterization and data analysis, the laboratory supports semiconductor process optimization, abnormality diagnosis, and device reliability improvement. It also provides students with professional training in materials analysis, process integration, problem diagnosis, and research and development.
Professor Jeou-Long Lee’s research primarily focuses on semiconductor material synthesis, thin-film fabrication, and materials characterization. His research areas encompass silicon-based semiconductors, wide-bandgap semiconductors, metallic thin films, dielectric materials, functional coatings, and nanomaterials.
His work involves the use of physical and chemical processes for thin-film deposition, surface modification, and composite material fabrication, with particular emphasis on investigating how processing parameters affect material composition, crystal structure, surface morphology, interface properties, and electrical characteristics. Through structural and elemental analysis, surface and interface characterization, thin-film thickness and uniformity measurements, as well as electrical and reliability evaluations, his research establishes correlations among synthesis conditions, microstructural properties, and semiconductor device performance.
These studies contribute to semiconductor process optimization, defect and failure analysis, the development of functional thin films, and the enhancement of device performance and reliability.
1. Jeou-Long Lee, Chao-Hsien Ho, Yi Lin and Yung-Kang Shen, “Fabrication and Detection for the Skeletons of Micro Aerial Vehicle Using Precision Injection Molding”, Key Engineering Materials, vols. 443, pp. 75-80 (2010) (EI).
2. Chih-Wei Wu, Jeou-Long Lee, Yi Lin and Yung-Kang Shen, “Surface Modification of Plastic Thin Film Using Anodic Aluminum Oxide Template for Nano-Imprint”, Key Engineering Materials, vols. 443, pp. 711-716 (2010). (EI).
3. Fwu-Hsing Liu, Wen-Hsueng Lin, Yung-Kang Shen and Jeou-Long Lee, “Fabrication Inner Channel Ceramics Using Layer Additive Method”, Key Engineering Materials, vols. 443, pp.528-533(2010)(EI)
Ph.D. in Chemical Engineering, National Taiwan University of Science and Technology (Taiwan Tech)
Job Description
basic research in engineering mathematics: Application
Preferred Intern Educational Level
Year 2 in university and above
Skill sets or Qualities
calculus, linear algebra, etc.